15th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems (ecbs 2008), 2008

Muhammad Ali Babar, Andrew Northway, Ian Gorton, Paul Heuer, Thong Nguyen

Catalysis Communications, vol. 9, iss. 13, pp. 2250-2252, 2008

R.S. Disselkamp, B.D. Harris, T.R. Hart

North American Journal of Fisheries Management, vol. 29, iss. 3, pp. 817-822, 2011

Christopher S. Guy, Eric W. Oldenburg, Paul C. Gerrity

Biosemiotics, vol. 6, iss. 1, pp. 1-7, 2012

Søren Brier, Cliff Joslyn

2008 5th International Conference on the European Electricity Market, 2008

Yuri V. Makarov, Shuai Lu, Bart McManus, John Pease

Physical Review Letters, vol. 101, iss. 8, 2008

Xiao-Peng Xing, Xue-Bin Wang, Lai-Sheng Wang

Energy Environ. Sci., vol. 3, iss. 1, pp. 111-113, 2010

David J. Heldebrant, Phillip K. Koech, Clement R. Yonker

Environmental Microbiology, vol. 13, iss. 12, pp. 3275-3288, 2011

Ji-Hoon Lee, David W. Kennedy, Alice Dohnálková, Dean A. Moore, Ponnusamy Nachimuthu, Samantha B. Reed, James K. Fredrickson

Climate Dynamics, vol. 36, iss. 3-4, pp. 431-449, 2010

Yi Wang, Charles N. Long, James H. Mather, Xiaodong Liu

International Journal of Hydrogen Energy, vol. 36, iss. 7, pp. 4549-4556, 2011

Jung Pyung Choi, K. Scott Weil, Y. Matt Chou, Jeffry W. Stevenson, Z. Gary Yang

IEEE Computer Graphics and Applications, vol. 31, iss. 5, pp. 18-29, 2011

Pak Chung Wong, Chaomei Chen, Carsten Görg, Ben Shneiderman, John Stasko, Jim Thomas

The International Journal of High Performance Computing Applications, vol. 24, iss. 2, pp. 228-239, 2010

Bruce Palmer, Vidhya Gurumoorthi, Alexandre Tartakovsky, Tim Scheibe

Journal of Molecular Spectroscopy, vol. 252, iss. 1, pp. 72-76, 2008

W.J. Lafferty, J.-M. Flaud, R.L. Sams, El Hadji Abib Ngom

Phys. Chem. Chem. Phys., vol. 10, iss. 8, pp. 1079-1090, 2008

Julia Laskin, Peng Wang, Omar Hadjar

Journal of Crystal Growth, vol. 310, iss. 7-9, pp. 1619-1626, 2008

Kannan Krishnaswami, Shivashankar R. Vangala, Helen M. Dauplaise, Lisa P. Allen, Gordon Dallas, Daniel Bakken, David F. Bliss, William D. Goodhue