Ultramicroscopy, vol. 108, iss. 1, pp. 43-51, 2007

C.M. Wang, D.R. Baer, J.E. Amonette, M.H. Engelhard, J.J. Antony, Y. Qiang

Chemical Engineering & Technology, vol. 29, iss. 3, pp. 307-312, 2006

C. Cao, S. C. Fung

Journal of Nuclear Materials, vol. 367-370, pp. 925-929, 2007

I.A. Portnykh, A.V. Kozlov, V.L. Panchenko, V.M. Chernov, F.A. Garner

Chemical Communications, iss. 48, pp. 5971, 2005

Radu Custelcean, Bruce A. Moyer, Benjamin P. Hay

Journal of Geophysical Research, vol. 111, iss. D14, 2006

J. J. Michalsky, G. P. Anderson, J. Barnard, J. Delamere, C. Gueymard, S. Kato, P. Kiedron, A. McComiskey, et al.

Organic Light Emitting Materials and Devices X, 2006

Linda S. Sapochak, Asanga B. Padmaperuma, Paul A. Vecchi, Hong Qiao, Paul E. Burrows, Zakya H. Kafafi, Franky So

IEEE Security & Privacy, vol. 2, iss. 4, pp. 54-56, 2004

D. Frincke, M. Bishop

Journal of Materials Research, vol. 21, iss. 4, pp. 811-815, 2006

W. Jiang, V. Shutthanandan, Y. Zhang, S. Thevuthasan, W.J. Weber, G.J. Exarhos

2006 International Microsystems, Package, Assembly Conference Taiwan, 2006

W.n. Liu, X. Sun, F. Shi

Applied Physics Letters, vol. 87, iss. 20, pp. 201915, 2005

H. P. Sun, X. P. Pan, G. W. Graham, H.-W. Jen, R. W. McCabe, S. Thevuthasan, C. H. F. Peden

The Journal of Physical Chemistry B, vol. 110, iss. 20, pp. 9743-9746, 2006

Dmitry Yu. Zubarev, Alexander I. Boldyrev, Xi Li, Lai-Sheng Wang

Inorganic Chemistry, vol. 45, iss. 4, pp. 1498-1507, 2006

Bevin W. Parks, Robert D. Gilbertson, James E. Hutchison, Elisabeth Rather Healey, Timothy J. R. Weakley, Brian M. Rapko, Benjamin P. Hay, Sergei I. Sinkov, et al.

Biology and Fertility of Soils, vol. 42, iss. 3, pp. 198-206, 2005

V. L. Bailey, J. L. Smith, H. Bolton

Industrial & Engineering Chemistry Research, vol. 44, iss. 9, pp. 3099-3105, 2005

Feng Zheng, Diana N. Tran, Brad J. Busche, Glen E. Fryxell, R. Shane Addleman, Thomas S. Zemanian, Christopher L. Aardahl

Clays and Clay Minerals, vol. 54, iss. 1, pp. 67-79, 2006

Jennifer L. Seabaugh, Hailiang Dong, Ravi K. Kukkadapu, Dennis D. Eberl, John P. Morton, Jinwook Kim