Quantification of dopant concentrations in dilute magnetic semiconductors using ion beam techniques

Journal Article
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 249, iss. 1-2, pp. 402-405, 2006
Authors
V. Shutthanandan, S. Thevuthasan, T. Droubay, T.C. Kaspar, A. Punnoose, J. Hays, S.A. Chambers
English