Publication - Journal Article Study of copper diffusion through a ruthenium thin film by photoemission electron microscopy

https://doi.org/10.1063/1.2712832
Journal Article
Applied Physics Letters, vol. 90, iss. 11, pp. 111906, 2007
Authors
Wei Wei, S. L. Parker, Y.-M. Sun, J. M. White, Gang Xiong, Alan G. Joly, Kenneth M. Beck, Wayne P. Hess
English