“Depth-Profiling” and Quantitative Characterization of the Size, Composition, Shape, Density, and Morphology of Fine Particles with SPLAT, a Single-Particle Mass Spectrometer

Journal Article
The Journal of Physical Chemistry A, vol. 112, iss. 4, pp. 669-677, 2008
Authors
Alla Zelenyuk, Juan Yang, Chen Song, Rahul A. Zaveri, Dan Imre
English