Publication - Journal Article Analysis of Fe nanoparticles using XPS measurements under d.c. or pulsed-voltage bias

https://doi.org/10.1002/sia.3260
Journal Article
Surface and Interface Analysis, vol. 42, iss. 6-7, pp. 859-862, 2010
Authors
Sefik Suzer, Donald R. Baer, Mark H. Engelhard
English