Publication - Proceedings Article Quantitative Determination of Deuterium Atom Concentration in Zinc Oxide Thin Films by Time-of-Flight Secondary Ion Mass Spectrometry

https://doi.org/10.1063/1.3120047
Conference Proceedings
AIP Conference Proceedings, 2009
Authors
Zihua Zhu, Vaithiyalingam Shutthanandan, Yuanjie Li, Scott A. Chambers, Floyd D. McDaniel, Barney L. Doyle
English