Publication - Journal Article Atomic-resolution defect contrast in low angle annular dark-field STEM DOI https://doi.org/10.1016/j.ultramic.2012.03.013 Journal Article Ultramicroscopy, vol. 116, pp. 47-55, 2012 Authors P.J. Phillips, M. De Graef, L. Kovarik, A. Agrawal, W. Windl, M.J. Mills Language English
