Publication - Journal Article Rutherford backscattering spectrometry characterization of nanoporous chalcogenide thin films grown at oblique angles

Journal Article

Journal of Analytical Atomic Spectrometry, vol. 23, iss. 7, pp. 981, 2008

Authors

R. J. Martín-Palma, A. Redondo-Cubero, R. Gago, J. V. Ryan, C. G. Pantano

Language English