Publication - Journal Article The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images DOI https://doi.org/10.1093/jmicro/dft042 Journal Article Microscopy, vol. 63, iss. 1, pp. 41-51, 2013 Authors Andrew Stevens, Hao Yang, Lawrence Carin, Ilke Arslan, Nigel D. Browning Language English
