Publication - Journal Article Nanoscale phase separation in epitaxial Cr-Mo and Cr-V alloy thin films studied using atom probe tomography: Comparison of experiments and simulation

Journal Article

Journal of Applied Physics, vol. 116, iss. 19, pp. 193512, 2014

Authors

A. Devaraj, T. C. Kaspar, S. Ramanan, S. Walvekar, M. E. Bowden, V. Shutthanandan, R. J. Kurtz

Language English