Publication - Journal Article Mapping electrostatic profiles across axial p-n junctions in Si nanowires using off-axis electron holography

Journal Article

Applied Physics Letters, vol. 103, iss. 15, pp. 153108, 2013

Authors

Zhaofeng Gan, Daniel E. Perea, Jinkyoung Yoo, S. Tom Picraux, David J. Smith, Martha R. McCartney

Language English