Publication - Journal Article Composition and interface analysis of InGaN/GaN multiquantum-wells on GaN substrates using atom probe tomography

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, vol. 32, iss. 5, pp. 051209, 2014

Fang Liu, Li Huang, Robert F. Davis, Lisa M. Porter, Daniel K. Schreiber, Satyanarayana V. N. T. Kuchibatla, Vaithiyalingam Shutthanandan, Suntharampillai Thevuthasan, Edward A. Preble, Tania Paskova, Keith R. Evans