Journal Article
Journal of Materials Chemistry C, vol. 3, iss. 8, pp. 1835-1845, 2015
Authors
P. S. Sankara Rama Krishnan, Jeffery A. Aguiar, Q. M. Ramasse, D. M. Kepaptsoglou, W.-I. Liang, Y.-H. Chu, N. D. Browning, P. Munroe, V. Nagarajan
Abstract
A combination of atom column-by-column scanning transmission electron microscopy and density functional theory shows how epitaxial strain alters the local electronic structure in mixed phase bismuth ferrite thin films.
English