Publication - Journal Article ToF-SIMS depth profiling of insulating samples, interlaced mode or non-interlaced mode? DOI https://doi.org/10.1002/sia.5419 Journal Article Surface and Interface Analysis, vol. 46, iss. S1, pp. 257-260, 2014 Authors Zhaoying Wang, Ke Jin, Yanwen Zhang, Fuyi Wang, Zihua Zhu Language English
