Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

Journal Article
Chemical Communications, vol. 53, iss. 53, pp. 7310-7313, 2017
Authors
A. Bhattarai, P. Z. El-Khoury
Abstract

Tip-enhanced Raman scattering may be used to image various aspects of plasmon-enhanced local electric fields with extremely high spatial resolution.

English