High resolution isotopic analysis of U-bearing particles via fusion of SIMS and EDS images

Journal Article
Journal of Analytical Atomic Spectrometry, vol. 31, iss. 7, pp. 1472-1479, 2016
Authors
Jay G. Tarolli, Benjamin E. Naes, Benjamin J. Garcia, Ashley E. Fischer, David Willingham
Abstract

The result of fusing energy-dispersive X-ray spectroscopy (EDS) and secondary ion mass spectrometry (SIMS) images of U-bearing particles.

English