Journal Article
Journal of Analytical Atomic Spectrometry, vol. 32, iss. 6, pp. 1092-1100, 2017
Authors
Tyler Green, Ilya Kuznetsov, David Willingham, Benjamin E. Naes, Gregory C. Eiden, Zihua Zhu, W. Chao, Jorge J. Rocca, Carmen S. Menoni, Andrew M. Duffin
Abstract
We characterize EUV TOF for trace analysis using NIST glasses and demonstrate nanoscale imaging on uranium oxide particles.
English