Publication - Journal Article Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?

Journal Article

Surface and Interface Analysis, vol. 51, iss. 2, pp. 219-225, 2018

Authors

Jiandong Zhang, Yanyan Zhang, Marie Collin, Stéphane Gin, James J. Neeway, Tieshan Wang, Zihua Zhu

Language English