Publication - Proceedings Article A Workflow for Visual Diagnostics of Binary Classifiers using Instance-Level Explanations

https://doi.org/10.1109/vast.2017.8585720
Conference Proceedings
2017 IEEE Conference on Visual Analytics Science and Technology (VAST), 2017
Authors
Josua Krause, Aritra Dasgupta, Jordan Swartz, Yindalon Aphinyanaphongs, Enrico Bertini
English