Publication - Journal Article Three-dimensional nanoscale characterisation of materials by atom probe tomography

International Materials Reviews, vol. 63, iss. 2, pp. 68-101, 2017

Arun Devaraj, Daniel E. Perea, Jia Liu, Lyle M. Gordon, Ty. J. Prosa, Pritesh Parikh, David R. Diercks, Subhashish Meher, R. Prakash Kolli, Ying Shirley Meng, Suntharampillai Thevuthasan