Publication - Journal Article Interface structure of the 1 monolayer (2×1)-Si/GaAs(001) system by x-ray photoelectron diffraction DOI https://doi.org/10.1116/1.586912 Journal Article Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 11, iss. 4, pp. 1459, 1993 Authors T. T. Tran Language English