Publication - Journal Article A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials

https://doi.org/10.1016/j.apsusc.2017.09.210

Journal Article

Applied Surface Science, vol. 433, pp. 994-1017, 2018

Authors

Shiladitya Chatterjee, Bhupinder Singh, Anubhav Diwan, Zheng Rong Lee, Mark H. Engelhard, Jeff Terry, H. Dennis Tolley, Neal B. Gallagher, Matthew R. Linford

Language English

Publication - Journal Article A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials

DOI