XPS guide: Charge neutralization and binding energy referencing for insulating samples

Journal Article
Journal of Vacuum Science & Technology A, vol. 38, iss. 3, pp. 031204, 2020
Authors
Donald R. Baer, Kateryna Artyushkova, Hagai Cohen, Christopher D. Easton, Mark Engelhard, Thomas R. Gengenbach, Grzegorz Greczynski, Paul Mack, David J. Morgan, Adam Roberts
English