Quasi 2D Ultrahigh Carrier Density in a Complex Oxide Broken-Gap Heterojunction

Journal Article
Advanced Materials Interfaces, vol. 3, iss. 2, pp. 1500432, 2015
Authors
Peng Xu, Timothy C. Droubay, Jong Seok Jeong, K. Andre Mkhoyan, Peter V. Sushko, Scott A. Chambers, Bharat Jalan
English