Publication - Journal Article Advanced FIB-based Preparation of Cryogenically-prepared Specimens for APT Analysis DOI https://doi.org/10.1017/s1431927619005129 Journal Article Microscopy and Microanalysis, vol. 25, iss. S2, pp. 878-879, 2019 Authors Daniel E. Perea, Daniel K. Schreiber, Mark Wirth, James E. Evans Language English