Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Journal Article
The Journal of Physical Chemistry C, vol. 120, iss. 42, pp. 24070-24079, 2016
Authors
Natalie A. Belsey, David J. H. Cant, Caterina Minelli, Joyce R. Araujo, Bernd Bock, Philipp BrĂ¼ner, David G. Castner, Giacomo Ceccone, Jonathan D. P. Counsell, Paul M. Dietrich, Mark H. Engelhard, Sarah Fearn, Carlos E. Galhardo, Henryk Kalbe, Jeong Won Kim, Luis Lartundo-Rojas, Henry S. Luftman, Tim S. Nunney, Johannes Pseiner, Emily F. Smith, Valentina Spampinato, Jacobus M. Sturm, Andrew G. Thomas, Jon P.W. Treacy, Lothar Veith, Michael Wagstaffe, Hai Wang, Meiling Wang, Yung-Chen Wang, Wolfgang Werner, Li Yang, Alexander G. Shard
English