Publication - Journal Article Bulk and Short‐Circuit Anion Diffusion in Epitaxial Fe ₂ O ₃ Films Quantified Using Buried Isotopic Tracer Layers

Advanced Materials Interfaces, vol. 8, iss. 9, pp. 2001768, 2021

Tiffany C. Kaspar, Sandra D. Taylor, Kayla H. Yano, Timothy G. Lach, Yadong Zhou, Zihua Zhu, Aaron A. Kohnert, Evan K. Still, Peter Hosemann, Steven R. Spurgeon, Daniel K. Schreiber