Publication - Journal Article Modeling thin layers of analytes on substrates for spectral analysis: use of solid/liquid n and k values to model reflectance spectra DOI https://doi.org/10.1117/1.oe.59.9.092005 Journal Article Optical Engineering, vol. 59, iss. 09, pp. 1, 2020 Authors Bruce E. Bernacki, Timothy J. Johnson, Tanya L. Myers Language English
