Publication - Journal Article Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes

https://doi.org/10.1063/5.0054646
Journal Article
Review of Scientific Instruments, vol. 92, iss. 11, pp. 113701, 2021
Authors
Shawn L. Riechers, Nikolai Petrik, John S. Loring, Mark K. Murphy, Carolyn I. Pearce, Greg A. Kimmel, Kevin M. Rosso
English