Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes

Journal Article
Nanoscale, vol. 12, iss. 41, pp. 21248-21254, 2020
Daniel Nicholls, Juhan Lee, Houari Amari, Andrew J. Stevens, B. Layla Mehdi, Nigel D. Browning

Determining the optimum electron dose distribution for damage mitigated scanning transmission electron microscopy imaging using subsampling and image inpainting.