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The theoretical prediction of x-ray absorption spectra (XAS) has become commonplace in electronic structure theory. The ability to better model and understand L-edge spectra is of great interest in the study of transition metal complexes and a wide variety of solid state materials. However, until...

The Physical Electronics Instruments (PHI) Quantum 2000 X-Ray Photoelectron Spectrometer (XPS) is a unique Micro-Focused Scanning X-Ray system that uses a focused monochromatic aluminum K X-ray beam that can be varied in size from as small as 10 μm in diameter to approximately 200 μm. The beam can...

The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...