The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...
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Showing 1 - 3 of 3
Data Source
The innovative Elstar™ electron column forms the basis of the Helios NanoLab’s outstanding high resolution imaging performance. The Elstar features unique technologies, such as constant power lenses for higher thermal stability, electrostatic scanning for faster, higher accurate imaging, and unique...
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Data Source
The Physical Electronics Instruments (PHI) Quantum 2000 X-Ray Photoelectron Spectrometer (XPS) is a unique Micro-Focused Scanning X-Ray system that uses a focused monochromatic aluminum K X-ray beam that can be varied in size from as small as 10 μm in diameter to approximately 200 μm. The beam can...