IEEE Security & Privacy Magazine, vol. 2, iss. 5, pp. 61-63, 2004

D. Frincke, M. Bishop

Technometrics, vol. 48, iss. 2, pp. 252-261, 2006

Dale N Anderson, David C Stromswold, Sharon C Wunschel, Anthony J Peurrung, Randy R Hansen

Journal of Facilities Management, vol. 3, iss. 1, pp. 27-40, 2005

Mike Moran, Marc Berman, Launa Morasch

IEEE Control Systems, vol. 24, iss. 4, pp. 53-61, 2004

Chemistry of Materials, vol. 17, iss. 17, pp. 4335-4343, 2005

Liyu Li, David L. King

Advances in Water Resources, vol. 29, iss. 2, pp. 268-280, 2006

Andy L. Ward, Z. Fred Zhang, Glendon W. Gee

The Journal of Chemical Physics, vol. 128, iss. 16, pp. 164111, 2008

Daniel T. Chang, Gregory K. Schenter, Bruce C. Garrett

Journal of the American Chemical Society, vol. 127, iss. 10, pp. 3254-3255, 2005

Yongsheng Chen, John L. Fulton, John C. Linehan, Tom Autrey

The Journal of Chemical Physics, vol. 124, iss. 22, pp. 224318, 2006

Shiyu Du, Joseph S. Francisco, Gregory K. Schenter, Tzvetelin D. Iordanov, Bruce C. Garrett, Michel Dupuis, Jun Li

Journal of the American Chemical Society, vol. 127, iss. 12, pp. 4208-4215, 2005

Jonathan L. Cape, Michael K. Bowman, David M. Kramer

Hyperfine Interactions, vol. 162, iss. 1-4, pp. 147-157, 2006

Klaus D. A. Wendt, Klaus Blaum, Christopher Geppert, Peter Müller, Wilfried Nörtershäuser, Annette Schmitt, Philipp Schumann, Norbert Trautmann, et al.

IEEE Symposium Conference Record Nuclear Science 2004.

D.C. Stromswold, J.W. Darkoch, J.H. Ely, R.R. Hansen, R.T. Kouzes, B.D. Milbrath, R.C. Runkle, W.A. Sliger, et al.

Journal of the American Chemical Society, vol. 127, iss. 17, pp. 6443-6450, 2005

Dunja Radisic, Kit H. Bowen,, Iwona Da̧bkowska, Piotr Storoniak, Janusz Rak, Maciej Gutowski

Applied Physics Letters, vol. 87, iss. 20, pp. 201915, 2005

H. P. Sun, X. P. Pan, G. W. Graham, H.-W. Jen, R. W. McCabe, S. Thevuthasan, C. H. F. Peden

Journal of Bacteriology, vol. 187, iss. 17, pp. 5877-5884, 2005

Renhui Li, M. Ben Potters, Liang Shi, Peter J. Kennelly