Proceedings of the National Academy of Sciences, vol. 102, iss. 14, pp. 5274-5279, 2005

Joanne T. Hulme, Keiichi Konoki, Teddy W.-C. Lin, Marina A. Gritsenko, David G. Camp, Diana J. Bigelow, William A. Catterall

Solid State Communications, vol. 139, iss. 8, pp. 434-438, 2006

A. Punnoose, M.H. Engelhard, J. Hays

Physical Review B, vol. 72, iss. 9, 2005

Jincheng Du, L. Rene Corrales

Proceedings of the 2005 IEEE International Workshop on Measurement Systems for Homeland Security, Contraband Detection and Personal Safety Workshop, 2005. (IMS 2005)

K.L. Silvers, B.J. Burghard, J.R. Skorpik, D.A. Clark

Nanotechnology, vol. 18, iss. 7, pp. 075303, 2007

Satyanarayana V N T Kuchibhatla, Ajay S Karakoti, Sudipta Seal

Calphad, vol. 28, iss. 1, pp. 41-48, 2004

Renee Russell, Raja Chellappa, Dhanesh Chandra

Molecular & Cellular Proteomics, vol. 3, iss. 4, pp. 311-326, 2004

N. Leigh Anderson, Malu Polanski, Rembert Pieper, Tina Gatlin, Radhakrishna S. Tirumalai, Thomas P. Conrads, Timothy D. Veenstra, Joshua N. Adkins, et al.

Journal of Proteome Research, vol. 4, iss. 4, pp. 1073-1085, 2005

Jon M. Jacobs, Joshua N. Adkins, Wei-Jun Qian, Tao Liu, Yufeng Shen, David G. Camp, Richard D. Smith

Journal of Proteome Research, vol. 5, iss. 12, pp. 3345-3354, 2006

Thomas O. Metz, Jon M. Jacobs, Marina A. Gritsenko, Ghislaine Fontès, Wei-Jun Qian, David G. Camp, Vincent Poitout, Richard D. Smith

Chemistry of Materials, vol. 17, iss. 17, pp. 4335-4343, 2005

Liyu Li, David L. King

Journal of The Electrochemical Society, vol. 153, iss. 10, pp. A1852, 2006

Zhenguo Yang, Guan-Guang Xia, Gary D. Maupin, Jeffry W. Stevenson

Nano Letters, vol. 7, iss. 4, pp. 1050-1053, 2007

Chenghong Lei, Yongsoon Shin, Jun Liu, Eric J. Ackerman

Sensor Letters, vol. 3, iss. 1, pp. 16-21, 2005

Xiaoli Cui, Guodong Liu, Liyu Li, Wassana Yantasee, Yuehe Lin

Journal of Geophysical Research: Atmospheres, vol. 107, iss. D21, pp. AAC 4-1-AAC 4-17, 2002

Y. Zhang, R. C. Easter, S. J. Ghan, H. Abdul-Razzak

Journal of Nuclear Materials, vol. 372, iss. 1, pp. 16-31, 2008

D.M. Strachan, R.D. Scheele, E.C. Buck, A.E. Kozelisky, R.L. Sell, R.J. Elovich, W.C. Buchmiller