The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...

This dataset includes one baseline and three cybersecurity based scenarios utilizing the IEEE 9 Bus Model. This instantiation of the IEEE 9 model was built utilizing the OpalRT Simulator ePhasorsim module, with Bus 7 represented by hardware in the loop (HiL). The HiL was represented by two SEL351s...