Rigaku Rapid II Microbeam is one of the most versatile micro-diffraction XRD system in materials analysis, using advanced imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials. The RAPID™ II Curved Detector X-Ray Diffraction (XRD) System's...
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Data Source
Bruker Daltonics SolariX Magnetic Resonance Mass Spectrometry (MRMS) instruments are available for different magnetic field strengths of 7T, 12T and 15T. The SolariX XR and 2xR instruments use magnetron control technology and a newly developed, high sensitivity, low noise preamplifier to exploit...
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The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...