Data Source - Instrument Rigaku Rapid II Microbeam X-Ray Diffractometer

Rigaku Rapid II Microbeam is one of the most versatile micro-diffraction XRD system in materials analysis, using advanced imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials. The RAPID™ II Curved Detector X-Ray Diffraction (XRD) System's curved IP detector has numerous advantages over other types of X-ray detectors, the most obvious being an extremely large active area, exceptionally low noise, and wide dynamic range. The large curved active area is advantageous because a massive solid angle of data is collected in a single exposure. While the wide dynamic range eliminates worrying about detector saturation, the curved-plate geometry of the RAPID II reduces oblique-incidence X-ray absorption effects seen with flat detectors of any kind.

X-ray diffraction (XRD) uses the interaction of X-rays with crystalline materials to identify mineralogical composition and obtain detailed information about the crystallographic and physical properties of materials. The most common application is identifying compounds, including minerals, in a powdered specimen. Quantitative analysis is possible through fitting the measured pattern with patterns calculated from known crystal structures. Further information, including cell parameters, which typically correlate with chemical composition, and anisotropic crystallite dimensions may also be obtained.

Data Source Contributions

• LN Anderson > Data Curation
• M Bowden > Resource Review

Instrument Data Source Profile

Instrument Name:     Rigaku Rapid II Microbeam

Model:                         RAPID II X-Ray Microdiffraction System with MicroMax-007 HF

Platform Type:            X-Ray Diffractometer

Data Type:                   Structural composition profiles

Software:                    Rigaku 2DP, TOPAS (Bruker AXS), JADE

Instrument Group:      X-Ray Diffraction, in situ X-Ray Diffraction, in situ Micro-X-Ray Diffraction (micro XRD)

Topic Areas:               Microbeam Particle-Induced X-Ray Emission Spectroscopy, Analytical Techniques

Explore this capability and more at EMSL's Analytical Instrument resources page under X-Ray Diffraction.

Federal Acknowledgements

This work was supported in part by the Earth and Biological Sciences Directorate (EBSD) at Pacific Northwest National Laboratory (PNNL), a multiprogram national laboratory managed by the Battelle Memorial Institute, operating under the U.S. Department of Energy (DOE) contract DE-AC05-76RL01830. User capabilities described here reflect collaborations with the Environmental Molecular Sciences Laboratory (EMSL), a DOE Office of Science (SC-3) user facility operating under the Contract No. DE-AC05-76RL01830.

Terms of Use

Recommendation guidelines provided by the DOE Office of Science can be accessed at the SC Funding Opportunities & Acknowledgements homepage. For additional information regarding user capability data release, visit the SC Digital Data Management Resources at User Facilities for more information.

EMSL Funding Acknowledgment

Scientists who publish results of research using EMSL resources, capabilities, and resulting data are required to include an acknowledgment of EMSL Policies in any publications. Learn more about user facility data management resources at the Office of Science Program page.