Rigaku Rapid II Microbeam is one of the most versatile micro-diffraction XRD system in materials analysis, using advanced imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials. The RAPID™ II Curved Detector X-Ray Diffraction (XRD) System's...

The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...

The innovative Elstar™ electron column forms the basis of the Helios NanoLab’s outstanding high resolution imaging performance. The Elstar features unique technologies, such as constant power lenses for higher thermal stability, electrostatic scanning for faster, higher accurate imaging, and unique...