The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...
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Data Source
Data Source
Stanford Synchrotron Radiation Lightsource Experimental Station 14-3b is a bending magnet side station dedicated to X-Ray Imaging and Micro X-Ray Absorption Spectroscopy of biological, biomedical, materials, and geological samples. Station 14-3b is equipped with specialized instrumentation for XRF...
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Data Source
Rigaku Rapid II Microbeam is one of the most versatile micro-diffraction XRD system in materials analysis, using advanced imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials. The RAPID™ II Curved Detector X-Ray Diffraction (XRD) System's...