The IONTOF TOF.SIMS 5 data source is a time-of-flight secondary ion mass spectrometer and powerful surface analysis tool used to investigate scientific questions in biological, environmental, and energy research. Among the most sensitive of surface analysis tools, it uses a high-vacuum technique...
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Data Source
Data Source
Last updated on 2024-03-03T02:26:52+00:00 by LN Anderson The Thermo Scientific™ Velos Pro™ Orbitrap Mass Spectrometer instrument data source combines advanced mass accuracy with an ultra-high resolution Orbitrap mass analyzer for increased sensitivity, enabling molecular weight determination for...
Data Source
Rigaku Rapid II Microbeam is one of the most versatile micro-diffraction XRD system in materials analysis, using advanced imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials. The RAPID™ II Curved Detector X-Ray Diffraction (XRD) System's...